The first release of the Chandra Source Catalog (CSC) contains ~95,000 X-ray
sources in a total area of ~0.75% of the entire sky, using data from ~3,900
separate ACIS observations of a multitude of different types of X-ray sources.
In order to maximize the scientific benefit of such a large, heterogeneous
data-set, careful characterization of the statistical properties of the
catalog, i.e., completeness, sensitivity, false source rate, and accuracy of
source properties, is required. Characterization efforts of other, large
Chandra catalogs, such as the ChaMP Point Source Catalog (Kim et al. 2007) or
the 2 Mega-second Deep Field Surveys (Alexander et al. 2003), while
informative, cannot serve this purpose, since the CSC analysis procedures are
significantly different and the range of allowable data is much less
restrictive. We describe here the characterization process for the CSC. This
process includes both a comparison of real CSC results with those of other,
deeper Chandra catalogs of the same targets and extensive simulations of
blank-sky and point source populations.
We present the Chandra Multiwavelength Project (ChaMP) X-ray point source
catalog with ~6,800 X-ray sources detected in 149 Chandra observations covering
\~10 deg^2. The full ChaMP catalog sample is seven times larger than the
initial published ChaMP catalog. The exposure time of the fields in our sample
ranges from 0.9 to 124 ksec, corresponding to a deepest X-ray flux limit of
f_{0.5-8.0} = 9 x 10^{-16} erg/cm2/sec. The ChaMP X-ray data have been
uniformly reduced and analyzed with ChaMP-specific pipelines, and then
carefully validated by visual inspection. The ChaMP catalog includes X-ray
photometric data in 8 different energy bands as well as X-ray spectral hardness
ratios and colors. To best utilize the ChaMP catalog, we also present the
source reliability, detection probability and positional uncertainty. To
quantitatively assess those parameters, we performed extensive simulations. In
particular, we present a set of empirical equations: the flux limit as a
function of effective exposure time, and the positional uncertainty as a
function of source counts and off axis angle. The false source detection rate
is ~1% of all detected ChaMP sources, while the detection probability is better
than ~95% for sources with counts >30 and off axis angle <5 arcmin. The typical
positional offset between ChaMP X-ray source and their SDSS optical
counterparts is 0.7+-0.4 arcsec, derived from ~900 matched sources.
The first release of the Chandra Source Catalog (CSC) contains ~95,000 X-ray sources in a total area of ~0.75% of the entire sky, using data from ~3,900 separate ACIS observations of a multitude of different types of X-ray sources. In order to maximize the scientific benefit of such a large, heterogeneous data-set, careful characterization of the statistical properties of the catalog, i.e., completeness, sensitivity, false source rate, and accuracy of source properties, is required. Characterization efforts of other, large Chandra catalogs, such as the ChaMP Point Source Catalog (Kim et al. 2007) or the 2 Mega-second Deep Field Surveys (Alexander et al. 2003), while informative, cannot serve this purpose, since the CSC analysis procedures are significantly different and the range of allowable data is much less restrictive. We describe here the characterization process for the CSC. This process includes both a comparison of real CSC results with those of other, deeper Chandra catalogs of the same targets and extensive simulations of blank-sky and point source populations.