
We studied the effect of water vapor on the performance of glass Resistive
Plate Chambers (RPCs) in the avalanche mode operation. Controlled and
calibrated amount of water vapor was added to the RPC gas mixture that has
C$_2$H$_2$F$_4$ as the major component. The deterioration in the performance of
RPC was observed while operating with wet gas and recovered after switching to
standard gas.

A novel approach which uses Fibre Bragg Grating (FBG) sensors has been
utilised to assess and monitor the flatness of Gaseous Electron Multipliers
(GEM) foils. The setup layout and preliminary results are presented.

We present a novel application of Fiber Bragg Grating (FBG) sensors in the
construction and characterisation of Micro Pattern Gaseous Detector (MPGD),
with particular attention to the realisation of the largest triple (Gas
electron Multiplier) GEM chambers so far operated, the GE1/1 chambers of the
CMS experiment at LHC. The GE1/1 CMS project consists of 144 GEM chambers of
about 0.5 m2 active area each, employing three GEM foils per chamber, to be
installed in the forward region of the CMS endcap during the long shutdown of
LHC in 21082019. The large active area of each GE1/1 chamber consists of GEM
foils that are mechanically stretched in order to secure their flatness and the
consequent uniform performance of the GE1/1 chamber across its whole active
surface. So far FBGs have been used in high energy physics mainly as high
precision positioning and repositioning sensors and as low cost, easy to
mount, low space consuming temperature sensors. FBGs are also commonly used for
very precise strain measurements in material studies. In this work we present a
novel use of FBGs as flatness and mechanical tensioning sensors applied to the
wide GEM foils of the GE1/1 chambers. A network of FBG sensors have been used
to determine the optimal mechanical tension applied and to characterise the
mechanical tension that should be applied to the foils. We discuss the results
of the test done on a fullsized GE1/1 final prototype, the studies done to
fully characterise the GEM material, how this information was used to define a
standard assembly procedure and possible future developments.

Gas Electron Multiplier (GEM) technology is being considered for the forward
muon upgrade of the CMS experiment in Phase 2 of the CERN LHC. Its first
implementation is planned for the GE1/1 system in the $1.5 < \mid\eta\mid <
2.2$ region of the muon endcap mainly to control muon level1 trigger rates
after the second long LHC shutdown. A GE1/1 tripleGEM detector is read out by
3,072 radial strips with 455 $\mu$rad pitch arranged in eight $\eta$sectors.
We assembled a fullsize GE1/1 prototype of 1m length at Florida Tech and
tested it in 20120 GeV hadron beams at Fermilab using Ar/CO$_{2}$ 70:30 and
the RD51 scalable readout system. Four small GEM detectors with 2D readout and
an average measured azimuthal resolution of 36 $\mu$rad provided precise
reference tracks. Construction of this largest GEM detector built todate is
described. Strip cluster parameters, detection efficiency, and spatial
resolution are studied with position and high voltage scans. The plateau
detection efficiency is [97.1 $\pm$ 0.2 (stat)]\%. The azimuthal resolution is
found to be [123.5 $\pm$ 1.6 (stat)] $\mu$rad when operating in the center of
the efficiency plateau and using full pulse height information. The resolution
can be slightly improved by $\sim$ 10 $\mu$rad when correcting for the bias due
to discrete readout strips. The CMS upgrade design calls for readout
electronics with binary hit output. When strip clusters are formed
correspondingly without chargeweighting and with fixed hit thresholds, a
position resolution of [136.8 $\pm$ 2.5 stat] $\mu$rad is measured, consistent
with the expected resolution of strippitch/$\sqrt{12}$ = 131.3 $\mu$rad. Other
$\eta$sectors of the detector show similar response and performance.

Performances of several single gap (gas gap 2 mm) prototype Resistive Plate
Chambers (RPC) made of high resistive ({\rho} \sim 1010  1012 {\Omega} cm)
bakelite, commercially available in India have been studied in recent times. To
make the inner electrode surfaces smooth, a thin coating of silicone has been
applied. An efficiency > 90% and time resolution \sim 2 ns (FWHM) have been
obtained for both the streamer and the avalanche mode. The induced charge
distributions of those silicone coated RPC are studied and the results are
presented. A numerical study on the effect of surface roughness of the
resistive electrodes on the electric field of the device has been carried out
using GarfieldneBEM code. A few results for a simplified model representing
surface roughness, measured using a surface profilometer for the bakelite
surfaces, have also been presented.

Efficient design and performance of electrically actuated MEMS devices
necessitate accurate estimation of electrostatic forces on the MEMS structures.
This in turn requires thorough study of the capacitance of the structures and
finally the charge density distribution on the various surfaces of a device. In
this work, nearly exact BEM solutions have been provided in order to estimate
these properties of a parallel narrow beam structure found in MEMS devices. The
effect of threedimensionality, which is an important aspect for these
structures, and associated fringe fields have been studied in detail. A
reasonably large parameter space has been covered in order to follow the
variation of capacitance with various geometric factors. The present results
have been compared with those obtained using empirical parametrized expressions
keeping in view the requirement of the speed of computation. The limitations of
the empirical expressions have been pointed out and possible approaches of
their improvement have been discussed.

A numerical method of determining the wire sag in a multiwire proportional
chamber used in RICH (ALICE) by solving the second order differential equation
which governs the wire stability has been presented. The three point Finite
Difference Method (FDM) has generated a tridiagonal matrix equation relating
the deflection of wire segments to the force acting on it. The precise
estimates of electrostatic force has been obtained from accurate field
computation using a nearly exact Boundary Element Method (neBEM) solver.

The signal induced by an electron on a pickup strip has been calculated in a
RPC used in INO calorimeter following Ramo's theorem. An accurate estimation of
weighting field has been obtained using a nearly exact Boundary Element Method
(neBEM) solver while the electron velocity from the real field values. The
calculation has shown a growth and subsequent fall of pickup signal with
duration about 90ps.

In this work, we have computed the three dimensional weighting potential,
field and pad response function (PRF) of typical time projection chambers (TPC)
using a recently formulated and developed boundary element method solver,
namely, the nearly exact BEM solver. A realistic geometry of the device is
found to have significant influence on the estimation of signal generation.

Simulation of new generation gas detectors is rendered complicated due to the
nontrivial nature of the electric field and simultaneous presence of several
lengthscales. Computation of the electrostatic field, however, is extremely
important since streamers in gas volume and streamers across the dielectric
surfaces are known to cause serious damage to Micro Pattern Gas Detectors
(MPGD)and are the main factors in limiting their gain. In this paper, we
present the use of a nearly exact Boundary Element Method (neBEM) solver that
overcomes most of the limitations of FEM packages and is capable of producing
accurate results.

MicroElectroMechanical Systems (MEMS) normally have fixed or moving
structures (plates or array of thin beams) with crosssections of the order of
microns and lengths of the order of tens or hundreds of microns. Electrostatic
forces play a very major role in maneuvering these devices, and hence, a
thorough understanding of the electrostatic properties of these structures is
of critical importance. Recently, a nearly exact boundary element method
(neBEM) solver has been developed and used to solve difficult problems related
to electrostatics of various devices. Because of the exact foundation
expressions, this solver has been found to be very accurate while solving
critical problems which normally necessitate special formulations involving
elegant, but difficult mathematics. In this work, we investigate the effects of
various possible approximations on the 3D electrostatic solutions obtained for
MEMS structures. In particular, we investigate the effects of discretization,
omission of surfaces with small amount of charge accumulation on the final
results such as the charge distribution on various surfaces or capacitance of a
given MEMS structure.

MicroElectroMechanical Systems (MEMS) comb drives are used for both as
sensors and actuators. As a result, they have been considered to be very
important in MEMS technology and has been under intense study for last few
years. The actuation and the sensitivity are both dependent in a major way on
the electrostatic configuration of the comb structure. As a result, accurate
estimation of the electrostatic configuration of comb drives is crucial in both
design and interpretation phases. The nearly exact Boundary Element Method
(neBEM) solver has been developed recently and used successfully to solve
difficult problems related to electrostatics. This solver uses exact analytic
expression for computing the influence of singularity distributions instead of
adopting the conventional and convenient approximation of nodal concentration
of charges. Due to the exact foundation expressions, the solver has been found
to be exceptionally accurate in the complete physical domain, including the
near field. In this work, we explore the possibility of using the neBEM solver
to solve 3D electrostatic problems related to comb drives. In particular, we
investigate the relationship between the accuracy achieved and the
computational expenses incurred for a realistic comb drive geometry. In the
process, we estimate the charge density distribution, potential distribution
and the capacitance of the comb structure. The study has led us to the
conclusion that the neBEM solver can yield very accurate estimates of all the
properties of interest at a reasonable computational expenditure.

Three dimensional field configuration has been simulated for a simple wire
chamber consisting of one anode wire stretched along the axis of a grounded
square cathode tube by solving numerically the boundary integral equation of
the first kind. A closed form expression of potential due to charge distributed
over flat rectangular surface has been invoked in the solver using Green's
function formalism leading to a nearly exact computation of electrostatic
field. The solver has been employed to study the effect of several geometrical
attributes such as the aspect ratio ($\lambda = \frac{l}{d}$, defined as the
ratio of the length $l$ of the tube to its width $d$) and the wire modeling on
the field configuration. Detailed calculation has revealed that the field
values deviate from the analytic estimates significantly when the $\lambda$ is
reduced to 2 or below. The solver has demonstrated the effect of wire modeling
on the accuracy of the estimated nearfield values in the amplification region.
The thin wire results can be reproduced by the polygon model incorporating a
modest number of surfaces ($\geq 32$) in the calculation with an accuracy of
more than 99%. The smoothness in the three dimensional field calculation in
comparison to fluctuations produced by other methods has been observed.

The threedimensional electrostatic field configuration in gas ionization
detectors has been simulated using an efficient and precise nearly exact
boundary element method (NEBEM) solver set up to solve an integral equation of
the first kind. This recently proposed formulation of BEM and the resulting
solver use exact analytic integral of Green function to compute the
electrostatic potential for charge distribution on flat surfaces satisfying
Poisson's equation. As a result, extremely precise results have been obtained
despite the use of relatively coarse discretization leading to successful
validation against analytical results available for twodimensional MWPCs.
Significant three dimensional effects have been observed in the electrostatic
field configuration and also on the force experienced by the anode wires of
MWPCs. In order to illustrate the applicability of the NEBEM solver for
detector geometries having multiple dielectrics and degenerate surfaces, it has
been validated against available FEM and BEM numerical solutions for similar
geometries.

Theoretically, the electric field becomes infinite at corners of two and
three dimensions and edges of three dimensions. Conventional finiteelement and
boundary element methods do not yield satisfactory results at close proximity
to these singular locations. In this paper, we describe the application of a
fast and accurate BEM solver (which usesexact analytic expressions to compute
the effect of source distributions on flatsurfaces) to compute the electric
field near threedimensional corners and edges. Results have been obtained for
distances as close as 1$\mu m$ near the corner/edge and good agreement has been
observed between the present results and existing analytical solutions.

Closed form expressions for threedimensional potential and force field due
to singularities distributed on a finite flat surface have been used to develop
a fast and accurate BEM solver. The exact expressions have been investigated in
detail and found to be valid throughout the complete physical domain. Thus, it
has been possible to precisely simulate the complicated characteristics of the
potential and force field in the nearfield domain. The BEM solver has been
used to compute the capacitance of a unit square plate and a unit cube. The
obtained values have compared well with very accurate values of the
capacitances available in the literature.

MicroElectroMechanical Systems (MEMS) normally have fixed or moving
structures with crosssections of the order of microns ($\mu m$) and lengths of
the order of tens or hundreds of microns. These structures are often plates or
array of thin beams which, owing to their smallness, can be moved or deflected
easily through the application of low voltages. Since electrostatic forces play
a very major role in maneuvering these devices, a thorough understanding of the
electrostatic properties of these structures is of critical importance,
especially in the design phase of MEMS. In many cases, the electrostatic
analysis of MEMS is carried out using boundary element method (BEM), while the
structural analysis is carried out using finite element method (FEM). In this
paper, we focus on accurate electrostatic analysis of MEMS using BEM. In
particular, we consider the problem of computing the charge distribution and
capacitance of thin conducting plates relevant to the numerical simulation of
MEMS. The reason behind the accuracy of the solver is the fact that it uses
closedform analytic expressions that are valid seamlessly throughout the
physical domain for computing the influence coefficients. Thus, it is possible
to avoid one of the most serious approximations of the BEM, namely, the
assumption that the effect of a charge distributed over a boundary element can
be approximated by charge located at the centroid of the element. Comparison
with other results available in the literature seems to indicate that the
present results are more accurate than the existing ones.

Exact expressions for threedimensional potential and force yield due to
uniform singularity distributed on a finite at rectangular surface have been
presented. The expressions, valid throughout the physical domain, have been
found to be consistent with other expressions available as special cases of the
same problem. Very accurate estimates of the capacitance of a unit square plate
and a unit cube have been made using them.